Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5391854 | Chemical Physics Letters | 2006 | 5 Pages |
Abstract
The electronic coupling is found to be very sensitive to intra base-pair deformations and its fluctuations can result in essential (several orders of magnitude) variation of the charge transfer rate.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Anna Sadowska-Aleksiejew, Janusz Rak, Alexander A. Voityuk,