| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5395535 | Journal of Electron Spectroscopy and Related Phenomena | 2017 | 7 Pages |
Abstract
Time and angle resolved X-ray photoelectron spectroscopy (TAARXPS) data, obtained from polystyrene samples exposed to an oxygen/helium plasma, have been interpreted using 1st order Tikhonov regularization to smooth the extracted depth profiles. Two methods for the choice of the regularization parameter, namely the L-curve method and leave-one-out cross-validation (LOOCV), are compared and contrasted.
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Authors
R.W. Paynter,