| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5395744 | Journal of Electron Spectroscopy and Related Phenomena | 2015 | 8 Pages |
Abstract
Simulations were conducted to generate and invert noisy ARXPS data, starting from known pseudo-step-function depth profiles. In the recovery of the depth profiles, a 1st-order Tikhonov regulator was compared with a Total Variation regulator. It was found that the profiles extracted using the Total Variation regulator tended to better resemble the true profile in the case of a single step function.
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Authors
R.W. Paynter,