| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5395916 | Journal of Electron Spectroscopy and Related Phenomena | 2015 | 5 Pages |
Abstract
Graphite oxide (GO) nanofilms on the SiO2/Si surface have been studied by photoelectron spectroscopy (XPS) with synchrotron radiation and by Auger electron spectroscopy (AES). Auger electron energies were determined for the basic functional GO groups: hydroxyl (COH) and epoxide (COC). The data obtained enabled developing a technique for the GO chemical and elemental composition determination. The technique allows controlling the hydrogen content in GO despite the impossibility of Auger emission from hydrogen.
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Authors
V.M. Mikoushkin, A.S. Kriukov, V.V. Shnitov, A.P. Solonitsyna, V.Yu. Fedorov, A.T. Dideykin, D.A. Sakseev, O.Yu. Vilkov, V.M. Lavchiev,