Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5396047 | Journal of Electron Spectroscopy and Related Phenomena | 2013 | 4 Pages |
Abstract
We have developed a linear polarization-dependent hard X-ray photoemission (HAXPES) measurement system, by which the orbital contribution in the valence bands as well as the conduction electrons in solids can be revealed. Our experimental set up, recent progress and a few examples of the linear polarization dependence of HAXPES spectra are shown. It is also shown that the polarization dependence of the core-level spectra is fairly explained by theoretical calculations of photoelectron angular distributions for single atoms.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Akira Sekiyama, Atsushi Higashiya, Shin Imada,