| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5396068 | Journal of Electron Spectroscopy and Related Phenomena | 2012 | 5 Pages |
Abstract
⺠XPS and REELS analysis can provide electronic and optical properties of materials. ⺠ZnO-based transparent conductive oxide thin films amply exhibit the usefulness of XPS and REELS analysis. ⺠REELS analysis shows the band gap increase from 3.0 eV to 3.5 eV as a result of adding Hf to InZnO.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Yus Rama Denny, Hye Chung Shin, Soonjoo Seo, Suhk Kun Oh, Hee Jae Kang, Dahlang Tahir, Sung Heo, Jae Gwan Chung, Jae Cheol Lee, Sven Tougaard,