| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5396084 | Journal of Electron Spectroscopy and Related Phenomena | 2013 | 10 Pages |
Abstract
⺠Development of spectrum processing software for XPS (Photoelectron Spectra). ⺠Research of both peak form and spectral background analysis of core level XP spectra. ⺠Comparison of the traditional Shirley background with the improved Tougaard background. ⺠Improvement of the Tougaard background method using new adjustable fit parameters. ⺠Integration of adjustable fit parameters in the inelastic electron scattering cross section.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
R. Hesse, M. WeiÃ, R. Szargan, P. Streubel, R. Denecke,