Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5396114 | Journal of Electron Spectroscopy and Related Phenomena | 2013 | 14 Pages |
Abstract
The key quantity in spintronic devices is the spin polarization of the current flowing through the various device components, which in turn is closely determined by the components' electronic structure. Modern spin- and angle-resolved photoemission spectroscopy (spin-ARPES) can map the details of the spin-polarized electronic structure in many novel material systems - both magnetic and nonmagnetic. In order to separate close-lying electronic states, however, an improvement in energy and angular resolution as well as information depth is still mandatory. We review several types of modern photoemission spectrometers capable of spin analysis and discuss the application of the technique for several physical systems including ferromagnetic thin films and topological insulators.
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Authors
L. Plucinski, C.M. Schneider,