| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5396133 | Journal of Electron Spectroscopy and Related Phenomena | 2013 | 5 Pages |
Abstract
⺠Near Edge X-ray Absorption Fine Structure investigated as tool for probing the conduction band in Cu(In,Ga)S2. ⺠Absorption edge of anion contains most pertinent electronic information. ⺠Development of Cu(In,Ga)2 band gap with increased Ga content reflected in anion absorption edge positions. ⺠Correspondence with theory found.
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Authors
Benjamin Johnson, Jo Klaer, Saoussen Merdes, Mihaela Gorgoi, Britta Höpfner, Antje Vollmer, Iver Lauermann,