| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5396191 | Journal of Electron Spectroscopy and Related Phenomena | 2012 | 7 Pages |
Abstract
⺠This work concludes the presence of oxide in MgO/transition-metal bi-layers. ⺠Thermal annealing causes a possible structural transformation of the oxide. ⺠This is first evidence for a possible structural change of the oxide. ⺠First use of the O K-edge XAS signature of TM oxides to confirm presence of oxide. ⺠We see a diffusion of oxygen and a decrease in interface roughness.
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Authors
D. Telesca, B. Sinkovic, See-Hun Yang, S.S.P. Parkin,