| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5396244 | Journal of Electron Spectroscopy and Related Phenomena | 2011 | 14 Pages |
Abstract
⺠Instrument geometrical-factors affecting the XPS angular dependence are described. ⺠The geometrical factors in XPS instruments are transferable to other systems. ⺠Practical protocols are presented for assessing the size of analysis area and volume. ⺠Practical protocols are presented for assessing the size of the X-ray beam spot. ⺠Practical protocols are described for assessing the manipulator's axis of rotation.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
A. Herrera-Gomez, F.S. Aguirre-Tostado, P.G. Mani-Gonzalez, M. Vazquez-Lepe, A. Sanchez-Martinez, O. Ceballos-Sanchez, R.M. Wallace, G. Conti, Y. Uritsky,