| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5396351 | Journal of Electron Spectroscopy and Related Phenomena | 2012 | 5 Pages |
Abstract
⺠Effect of thin films on XPD intensities from a substrate. ⺠Intensity minima in XPD curves from substrate corresponding to intensity maxima in those from film. ⺠These effects can be explained in terms of multiple scattering of photoelectrons.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
A. Atrei,