| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5396355 | Journal of Electron Spectroscopy and Related Phenomena | 2012 | 11 Pages |
Abstract
⺠Weak influence of the support on photoemission from an overlayer. ⺠Accurate description of photoelectron intensity from overlayer by analytical theory. ⺠Method for overlayer thickness measurements based on analytical formalism. ⺠Influence of photoelectron elastic scattering on calculated thickness.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
A. Jablonski,