| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5396390 | Journal of Electron Spectroscopy and Related Phenomena | 2012 | 7 Pages |
Abstract
⺠Microprobe ARPES is successfully applied to studies on graphene. ⺠We propose a novel approach by applying dark field methods to XPEEM. ⺠The lateral resolution in dark field XPEEM is better than 40 nm. ⺠Dark field XPEEM is applied to O/W(1 1 0) to determine adsorption site symmetry.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Tevfik Onur MenteÅ, Andrea Locatelli,