Article ID Journal Published Year Pages File Type
5396397 Journal of Electron Spectroscopy and Related Phenomena 2012 8 Pages PDF
Abstract
► X-PEEM is used to probe the domain structure in antiferromagnetic nanostructures. ► Extended antiferromagnetic domains are stabilized along nanostructure edges. ► Multiple degenerate antiferromagnetic easy axes are stabilized in epitaxial heterostructures.
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Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Preview
X-PEEM study of antiferromagnetic domain patterns in LaFeO3 thin films and embedded nanostructures
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