| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5396431 | Journal of Electron Spectroscopy and Related Phenomena | 2012 | 9 Pages |
Abstract
⺠Noise is an important factor affecting the fitting of overlapping peaks in XPS data. ⺠The combined information in ARXPS data can be used to improve fitting reliability. ⺠The error on the estimation of the peak parameters depends on the peak-fitting method. ⺠Simultaneous fitting method is much more robust against noise than sequential fitting. ⺠The estimation of the error range is better done with ARXPS data than with XPS data.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Jaime Muñoz-Flores, Alberto Herrera-Gomez,