Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5396600 | Journal of Electron Spectroscopy and Related Phenomena | 2009 | 4 Pages |
Abstract
The regularization method of solving ill-posed problem is used to determine three partial interatomic distances from one EXAFS spectrum. The mathematical procedure and the experimental results of the EXAFS analysis for multilayer FeNi/V nanostructures are discussed. The measurements were performed using ESRF facilities (BM line 26A, Grenoble, France). The Fe, Ni and V edge absorption spectra were recorded in fluorescence and transmission modes at room temperature for foils Fe, Ni, V and for multilayer nanostructures [Fe82Ni18(5ML)/V(6ML)]25, [Fe82Ni18(10ML)/V(6ML)]25, films Fe82Ni18, Fe, Ni, V (1000Â Ã
thickness) in fluorescence mode only. All film samples were prepared at University Uppsala (Sweden). Peculiar features of the method are high resolution for overlapping in r-space shells and high accuracy in the determination of partial interatomic distances.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Yu.A. Babanov, Yu.A. Salamatov, I.Yu. Kamensky, A.V. Ryazhkin, V.V. Ustinov,