| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5396649 | Journal of Electron Spectroscopy and Related Phenomena | 2010 | 5 Pages |
Abstract
Total reflection X-ray photoelectron spectroscopy (TRXPS) is reviewed and all the published papers on TRXPS until the end of 2009 are included. Special emphasis is on the historical development. Applications are also described for each report. The background reduction is the most important effect of total reflection, but interference effect, relation to inelastic mean free path, change of probing depth are also discussed.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Jun Kawai,