| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5396681 | Journal of Electron Spectroscopy and Related Phenomena | 2010 | 10 Pages |
Abstract
Regularized oxygen concentration depth profiles were extracted from ARXPS data obtained on a plasma-oxidized polystyrene sample, using a variety of regulators and over a wide range of values for the regularization parameter. The plausibility of the profiles obtained was assessed with respect to strong and weak criteria based on a priori considerations. It was found that the most plausible results were obtained with regulators based upon the slopes or the curvatures exhibited in the profile.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
R.W. Paynter,