Article ID Journal Published Year Pages File Type
5396918 Journal of Electron Spectroscopy and Related Phenomena 2007 4 Pages PDF
Abstract
Fully differential cross-sections for single ionization of helium by 102 eV and by 1 keV electron impact have been obtained using an advanced reaction microscope. The data cover a large range of emission angles for a low-energy (E ≤ 15 eV) electron and different scattering angles for the fast electron. Significant electron emission out of the projectile scattering plane in between the binary and the recoil lobes is observed. The experimental data are compared with theoretical predictions from a three-Coulomb wave function model.
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Authors
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