Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5396987 | Journal of Electron Spectroscopy and Related Phenomena | 2007 | 6 Pages |
Abstract
Ge KL23L23 Auger spectra photoexcited (using bremsstrahlung radiation) from thin Ge films were measured with high energy resolution. The measured spectra were corrected for effects of inelastic electron scattering within the films, using two different models for estimating inelastic backgrounds. From the corrected Auger spectra the relative transition energies, the relative intensities and the energy widths of the KL23L23 Auger lines were evaluated and compared to earlier results obtained from X-ray induced Auger spectra, from Auger spectra emitted from radioactive isotopes and from Auger spectra induced by high energy electrons transmitted through ultrathin Ge layers.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
L. Kövér, S. Egri, Z. Berényi, J. Tóth, I. Cserny, D. Varga,