| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5397014 | Journal of Electron Spectroscopy and Related Phenomena | 2006 | 6 Pages |
Abstract
The synchrotron-radiation-induced structural degradation in polystyrene thin films was analyzed by comparing measured ultraviolet photoemission spectroscopy (UPS) spectra with model molecular orbital calculations. The analysis confirms degradation of the phenyl pendant groups and the generation of conjugated double-bonds in the degraded polymer. The observed degradation in polystyrene is found to be very similar to one from polyethylene previously investigated.
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Physical and Theoretical Chemistry
Authors
Orhan Kizilkaya, Masaki Ono, Eizi Morikawa,