Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5397050 | Journal of Electron Spectroscopy and Related Phenomena | 2007 | 4 Pages |
Abstract
Photon stimulated ion desorption (PSID) and Auger decay spectra were measured for condensed thiolane around the S 1s-edge. For thiolane a much richer fragment ions were observed in PSID mass spectrum than that for thiophene. Partial ion yield (PIY) curves have been determined for the fragment ions as a function of the photon energy. The first resonance in thiolane, attributed to the resonance from S 1s into an antiboning Ï*(C-S) state, seems to induce highly specific S+ desorption as compared to thiophene. Furthermore, it was found that the indirect X-ray induced electron stimulated desorption (XESD) mechanism plays an important role in ionic desorption from thiolane with exception for S+ ions.
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Authors
M.L.M. Rocco, T. Sekiguchi, Y. Baba,