| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5397092 | Journal of Electron Spectroscopy and Related Phenomena | 2007 | 4 Pages |
Abstract
The X-ray photoabsorption spectra of ZrO2 films with different phase compositions were measured. The analysis of the results obtained shows that due to the site-sensitivity the X-ray photoabsorption spectroscopy is an attractive method for characterization of the ZrO2 structure. This allows application of the X-ray spectroscopy in investigation of the crystal structure in the various stages of the thin film growth including the initial stage of the ZrO2 growth.
Related Topics
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Physical and Theoretical Chemistry
Authors
A. Kikas, J. Aarik, V. Kisand, K. Kooser, T. Käämbre, H. Mändar, T. Uustare, R. Rammula, V. Sammelselg, I. Martinson,