Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5397108 | Journal of Electron Spectroscopy and Related Phenomena | 2007 | 4 Pages |
Abstract
Ti 3d electronic structure of Ti2O3 has been investigated by means of soft X-ray photoemission spectroscopy (SXES) in the Ti 2p-3d absorption region. In the SXES spectra, the Raman peaks due to the a1g-egÏ and a1g-egÏ excitations are observed at 1.3 and 3.3Â eV below the incident photon energy, respectively. The intensity of the a1g-egÏ peak in the SXES spectrum measured between the 2p3/2-3d and 2p1/2-3d absorption peaks depends on the polarization of the incident photon E; the peak observed clearly in case of E parallel to the c-axis, almost disappears in case of E perpendicular to the c-axis.
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Authors
H. Sato, K. Tsuji, K. Yoshikawa, Y. Tezuka, S. Nishimoto, M. Higashi, F. Iga, M. Tsubota, M. Takemura, T. Takabatake, M. Taniguchi,