Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5397315 | Journal of Electron Spectroscopy and Related Phenomena | 2006 | 6 Pages |
Abstract
A modification to the quantification procedure used by a multi-mode X-ray photoelectron spectrometer (XPS) instrument is described which enables transfer of quantification between instruments, and which is referenced to a verified source. The procedure takes account of the intensity/energy response function of the instrument, which is appended to the data file, eliminating ambiguities in intensity calibration at a later date, and allowing background subtraction techniques based on electron scattering to be used on corrected spectra. A strategy is proposed to minimise inaccuracies arising from surface contamination and low signal intensity. Use of the procedure is illustrated by comparing quantification using different data processing software.
Related Topics
Physical Sciences and Engineering
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Physical and Theoretical Chemistry
Authors
John Walton, Neal Fairley,