| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5397890 | Journal of Luminescence | 2017 | 13 Pages |
Abstract
In the present study, a succession of thulium (Tm)-doped zinc oxide (ZnO) nanostructures samples were prepared by sol-gel method using zinc acetate dihydrate, thulium nitrate pentahydrate and sodium hydroxide species with absolute ethanol as solvent. The X-Ray diffraction (XRD) revealed phase purity (hexagonal Würtzite structure) and high crystalline nature of both Tm3+ doped and undoped ZnO samples. Furthermore, defects mediated levels in the samples were investigated by means of photoluminescence (PL) spectroscopy. Finally, Tm 4d core level was detected in ZnO: 0.5Â mol% Tm3+ sample from high resolution X-Ray Photoelectron Spectroscopy (XPS) scan.
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Authors
G.L. Kabongo, G.H. Mhlongo, B.M. Mothudi, K.T. Hillie, P.S. Mbule, M.S. Dhlamini,