Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5400923 | Journal of Luminescence | 2012 | 10 Pages |
Abstract
In this paper, we report on SiO2 thin films doped with Si-nc's and erbium. Time resolved PL measurements reveal two distinct 1.54 μm Er decay components; a fast microsecond component, and a relatively long lifetime component (10 ms). We also study the structural properties of these samples through TEM measurements, and reveal the formation of Er clusters. We propose that these Er clusters are responsible for the fast μs decay component, and we develop rate equation models that reproduce the experimental transient observations, and can explain some of the reported transient behaviour in previously published literature.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Miraj Shah, Maciej Wojdak, Anthony J. Kenyon, Matthew P. Halsall, Hang Li, Iain F. Crowe,