Article ID Journal Published Year Pages File Type
5400949 Journal of Luminescence 2013 6 Pages PDF
Abstract
► We report time-resolved PL measurements of Si-Ncs embedded in SiO2 matrix. ► Net decrease of PL with increasing the annealing temperature has been observed. ► Lifetime distribution analysis revealed a multiexponential decay with ns and ps components. ► Ps components are consistent with the lifetime range of the Auger recombination times. ► No evidence for a fast direct transition at the Brillouin zone centre.
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
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