Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5400949 | Journal of Luminescence | 2013 | 6 Pages |
Abstract
⺠We report time-resolved PL measurements of Si-Ncs embedded in SiO2 matrix. ⺠Net decrease of PL with increasing the annealing temperature has been observed. ⺠Lifetime distribution analysis revealed a multiexponential decay with ns and ps components. ⺠Ps components are consistent with the lifetime range of the Auger recombination times. ⺠No evidence for a fast direct transition at the Brillouin zone centre.
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Authors
D. Diamare, M. Wojdak, S. Lettieri, A.J. Kenyon,