| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5401127 | Journal of Luminescence | 2013 | 10 Pages |
Abstract
⺠We describe the capabilities of a new CW-XEOL and TR-XEOL detection system for a hard X-ray beamline. ⺠We model TR XEOL with luminescence lifetimes from â¼25 ps to â¼400 ps from framework silicates. ⺠CW XEOL, 200-900 nm with a resolution of â¼0.9 nm is used to complete dose and dose rate experiments. ⺠Micro-beam high spatial resolution XEOL within X-ray excitation energies 2-20 keV.
Keywords
(IP)(CL)(IR)XEOLUniversal serial busUltravioletX-ray excited optical luminescenceConstant fraction discriminatorTime resolvedTime resolved photoluminescenceSynchrotroncharge coupled deviceTime correlated single photon countingX-ray absorption spectroscopyfull width half maximumPhoto Multiplier TubeX-ray fluorescencePhotoluminescenceOSL, Optically stimulated luminescenceInfraredCanadian Light Sourcefluorescence lifetime imaging microscopyScanning near-field optical microscopyInternet protocolCathodoluminescenceThermoluminescence
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
R.P. Taylor, A.A. Finch, J.F.W. Mosselmans, P.D. Quinn,