Article ID Journal Published Year Pages File Type
5401946 Journal of Luminescence 2011 4 Pages PDF
Abstract
► EL spectra were employed to probe triplet exciton diffusion length (LT). ► The relationship between mCP EL intensity and doped layer thickness was studied. ► The LT (∼15 nm) was induced by an abrupt decrease in variation of mCP EL intensity.
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Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Preview
Study on triplet exciton diffusion length of mCP in phosphorescent organic light-emitting devices using electroluminescent spectra
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