Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5402870 | Journal of Luminescence | 2010 | 5 Pages |
Abstract
Silicon clusters embedded in a silicon dioxide matrix were prepared by ultrasound-assisted implantation resulting in a modified concentration of suboxide states as revealed by high-resolution photoelectron spectroscopy. It is suggested that ultrasound treatment results in formation of different interface structure between silicon cluster and silicon dioxide matrix which is characterized by a distinctly reduced concentration of the suboxide states. It is observed that photoluminescence properties are strongly correlated with the concentration of the suboxide states thereby providing an evidence that besides a quantum confinement effect a closer look at the chemical composition of the nc-Si/SiO2 system is important.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Andriy Romanyuk, Viktor Melnik, Yaroslav Olikh, Johannes Biskupek, Ute Kaiser, Martin Feneberg, Klaus Thonke, Peter Oelhafen,