Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5404139 | Journal of Luminescence | 2006 | 4 Pages |
Abstract
Relaxation and diffusion processes of high-density excitons in layered-type semiconductor PbI2 have been investigated through femtosecond transient grating and time-resolved luminescence measurements under two-photon absorption. We observed two luminescence bands at low temperature; one is due to an exciton-exciton collision process, while the other originates from localized excitonic states. By utilizing the transient grating spectroscopy, the lifetime and diffusion coefficient of the high-density excitons in PbI2 are estimated to be 72Â ps and 4.6Â cm2/s, respectively. The lifetime observed is almost equal to the values of the decay time of the luminescence due to the exciton-exciton collision process and the rise time of the luminescence due to the localized excitons. This strongly shows that the decay of the exciton-exciton collision process is dominated by the exciton trapping to the localized states arising from potential fluctuations due to imperfection of crystal.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Toshihiko Hosoya, Keita Tanaka, Ryo Fukaya, Jun Takeda,