Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5421544 | Surface Science | 2016 | 5 Pages |
Abstract
X-ray diffraction texture pattern of a Ge deposit exhibiting axiotaxial relationship with its SrTiO3 substrate. The diffraction peak pattern corresponds exactly to the axiotaxy locus, showing alignment of the Ge <Â 1 1 0Â > direction parallel to STO <Â 1 0 0Â > direction.361
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Authors
A. Danescu, J. Penuelas, B. Gobaut, G. Saint-Girons,