Article ID Journal Published Year Pages File Type
5421544 Surface Science 2016 5 Pages PDF
Abstract
X-ray diffraction texture pattern of a Ge deposit exhibiting axiotaxial relationship with its SrTiO3 substrate. The diffraction peak pattern corresponds exactly to the axiotaxy locus, showing alignment of the Ge < 1 1 0 > direction parallel to STO < 1 0 0 > direction.361
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
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