Article ID Journal Published Year Pages File Type
5422517 Surface Science 2013 5 Pages PDF
Abstract
► Electronic structures of thin films of silicon monoxides were elucidated. ► Si K-edge XAFS spectra showed the existence of silicon di-valence states. ► Polarization dependence of XAFS revealed that the molecules are perpendicularly oriented.
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Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Preview
Electronic structures of silicon monoxide film probed by X-ray absorption spectroscopy
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