| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5422561 | Surface Science | 2013 | 5 Pages |
Abstract
⺠Absolute depth profiling of thin films by Coulomb explosion of H2+ ions is proposed. ⺠The Coulomb broadening of the energy-loss straggling of the fragments is measured. ⺠Coulomb broadening and dwell time of the fragments are correlated in a depth scale. ⺠Transmission electron microscopy corroborates the proposed technique.
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Authors
S.M. Shubeita, R.C. Fadanelli, J.F. Dias, P.L. Grande,