| Article ID | Journal | Published Year | Pages | File Type | 
|---|---|---|---|---|
| 5422587 | Surface Science | 2012 | 4 Pages | 
We have used variable polarization synchrotron radiation to map the valence band electronic structure of graphite by angle-resolved photoemission spectroscopy (ARPES). The experimental results with two orthogonal linear polarization of light signifies the contribution of either even or odd symmetry with respect to the crystal mirror plane towards the photoemission intensity. The Ï1 and Ï2 valence bands show odd reflection symmetry while the Ï valence band shows even symmetry with respect to the mirror plane. The measured ARPES spectrum using left and right circular polarized lights shows asymmetry in intensity around M point of the Brillouin zone, which ultimately mimicking different partial wave character of Ï1 and Ï3 bands.
⺠Variable polarization synchrotron radiation has been used to map the graphite valence bands. ⺠The Ï1 and Ï2 valence bands are of odd parity while the Ï valence band is of even parity with respect to the mirror symmetry plane. ⺠The photoemission spectrum using left and right circular polarized lights shows asymmetry in intensity around M point. ⺠The Ï1 and Ï3 bands consist of different partial wave character.
