Characterization of 1T-TiSe2 surface by means of STM and XPD experiments and model calculations

Article ID	Journal	Published Year	Pages	File Type
5422667	Surface Science	2012	11 Pages	PDF

Abstract

âº Surface structure 1T-TiSe2 has been characterized by means of STM and XPD methods. âº The TiSe2 structure was reconstructed from photoelectron holograms both Ti and Se. âº The 1T-TiSe2 surface structure does have 1T-polytype with distortion. âº The Van-der-Waals gap between two topmost slabs Se-Ti-Se is expanded. âº Lattice parameter a0 of TiSe2 structure is expanded up to 3.83Â Ã.

Keywords

Surface relaxation surface structure Scanning tunneling microscopy Photoelectron holography X-ray photoelectron diffraction

Related Topics

Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry

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Characterization of 1T-TiSe2 surface by means of STM and XPD experiments and model calculations

Authors

M.V. Kuznetsov, I.I. Ogorodnikov, A.S. Vorokh, A.S. Rasinkin, A.N. Titov,