| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5422708 | Surface Science | 2013 | 8 Pages |
Abstract
⺠Thickness determination from ellipsometry without optical model ⺠ZnO thickness increases linearly with potential in the “pseudo-passive” regime. ⺠Density of interfacial layer in constant during potential increase ⺠Potentiostatic treatment shows an aging of the interfacial layer to yield ZnO. ⺠Absorption spectrum of the oxide is modified by metal transport.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Ying Chen, Andreas Erbe,