| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5422728 | Surface Science | 2013 | 4 Pages |
Abstract
⺠AFM characterization of pentacene film on parylene and benzocyclobutene substrates ⺠Power spectral density analysis of images revealed a critical thickness at 30 nm. ⺠This thickness was correlated to growth mode evolution.
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Authors
Maksym Iazykov, Mohsen Erouel, Jacques Tardy, Valeriy A. Skryshevsky, Magali Phaner-Goutorbe,