| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5422853 | Surface Science | 2012 | 8 Pages |
Abstract
⺠Investigation of Cs oxide aggregation in SIMS craters in Alq3 and CuPc samples ⺠Characterization by AFM, SIMS imaging, AES and XPS ⺠Investigation of topography variation as a function of air exposure ⺠Influence of sample composition on Cs oxide aggregation
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Khanh Q. Ngo, Patrick Philipp, John Kieffer, Tom Wirtz,