| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5422938 | Surface Science | 2011 | 11 Pages |
Abstract
⺠WD X-ray Spectroscopy can be used to quantify grain boundary segregation in a SEM. ⺠The technique can be used on ex-situ fractured samples. ⺠The precision and limit of detection is a couple of ng.cm-2 or percents of a monolayer.
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Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
P. Nowakowski, F. Christien, M. Allart, Y. Borjon-Piron, R. Le Gall,