| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5422952 | Surface Science | 2012 | 7 Pages |
Abstract
⺠CuO nanowires were manipulated on amorphous silicon inside scanning electron microscope. ⺠The elastic deformation of a manipulated nanowire was used to determine the distributed static friction force. ⺠Interfacial shear stress calculated using real contact areas for substrates of different roughness.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Boris Polyakov, Sergei Vlassov, Leonid M. Dorogin, Peteris Kulis, Ilmar Kink, Rynno Lohmus,