Article ID Journal Published Year Pages File Type
5423094 Surface Science 2012 8 Pages PDF
Abstract
► Er films deposited on W were studied using an atom probe. ► Crystallographic structures for clean and deuterated Er films were determined for both annealed and non-annealed films. ► Evaporation fields were measured for the bulkEr and the Er/W interfacial layer.
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Authors
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