Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5423094 | Surface Science | 2012 | 8 Pages |
Abstract
⺠Er films deposited on W were studied using an atom probe. ⺠Crystallographic structures for clean and deuterated Er films were determined for both annealed and non-annealed films. ⺠Evaporation fields were measured for the bulkEr and the Er/W interfacial layer.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
I. Solano, P.R. Schwoebel,