| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5423114 | Surface Science | 2011 | 6 Pages |
Abstract
⺠Specular and diffuse X-ray scattering measurements of Nb/Pd0:81Ni0:19 multilayers. ⺠Correlated behavior of interface roughness. ⺠Simulation and modeling of X-ray reflectivity to extract values for the layers thickness.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
A. Vecchione, R. Fittipaldi, C. Cirillo, M. Hesselberth, J. Aarts, S.L. Prischepa, V.N. Kushnir, M.Yu. Kupriyanov, C. Attanasio,