| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5423121 | Surface Science | 2011 | 10 Pages |
Abstract
⺠Directional Ar+-induced electron yields from Cu are modelled by molecular dynamics. ⺠The critical Ar-Cu apsidal distance for electron emission is 0.47 ± 0.03 Ã
. ⺠The model describes the energy dependence of Ar+-Cu electron yields. ⺠The spatial distributions of hard inelastic Ar+-Cu collisions are described.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
M.A. Karolewski, R.G. Cavell,