| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5423198 | Surface Science | 2012 | 7 Pages |
Abstract
⺠Single crystal La2NiO4 films were grown on STO (001) substrates by use of pulsed laser deposition (PLD). ⺠It was found that these films grow with the c-axis in the out of plane direction up to a certain critical thickness. ⺠Films thicker than that resulted in a structural reorientation from c-axis to a-axis out of plane orientation. ⺠The evolution of the c and a axis as a function of film thickness were measured by using a four circle X-ray diffractometer.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
D. Telesca, B.O. Wells, B. Sinkovic,