Article ID Journal Published Year Pages File Type
5423417 Surface Science 2012 8 Pages PDF
Abstract
► Transition metal silicides are fabricated by using ion-beam cosputter deposition. ► Long-range ordered structures are achieved through thermal annealing. ► Possible silicide phases are predicted by Pretorius' model. ► XPS chemical shift is studied through Auger parameters investigation.
Keywords
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Preview
XRD and XPS characterisation of transition metal silicide thin films
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