| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5423565 | Surface Science | 2011 | 9 Pages |
Abstract
⺠We compare concentration depth profiles at liquid surfaces determined with NICISS and ARXPS. ⺠Three different criteria were applied to compare the concentration depth profiles. ⺠Good agreement between the profiles was found for the surface excess. ⺠Good agreement was found for the length scale of most of the profiles. ⺠The separation of cation and anion can be measured with NICISS at low kinetic energies.
Related Topics
Physical Sciences and Engineering
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Physical and Theoretical Chemistry
Authors
Chuangye Wang, Gunther G. Andersson,