| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5423567 | Surface Science | 2011 | 9 Pages |
Abstract
⺠Layer-by-layer growth of Mg/Ru(0001) studied by LEEM and STM. ⺠Observed oscillations in the electron reflected intensity as a function of thickness. ⺠LEED in LEEM shows in-plane spacing changes with sub-monolayer coverage. ⺠On films several ML thick stacking faults and screw dislocations are observed. ⺠Screw dislocations are caused by the mismatch in heights of the Mg and Ru steps.
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Authors
T. Herranz, B. Santos, K.F. McCarty, J. de la Figuera,